Pemalite said: This has been an issue for years... The smaller we make the chips, the higher the chances of leakage... The more leakage, the more heat, the more limited we are with clockrates. |
That's true, although I was thinking specifically of increases in parasitic capacitance and leakage with sub-10 nm contacts. Apparently, these can be significant enough to decrease frequencies at a constant power density depending on the node.
The 5 nm threshold for mobility collapse from quantum tunneling comes from the width of the silicon transistor fin, which is around 8 nm for TSMC's N3, not gate or metal pitches. In fact, the limit is more like 7 nm for FINFETs, so TSMC is skirting the line with N3... and everyone else has moved to GAAFETs.
Nodes used to be named after half of the minimum metal pitch (so that'd be 24/2 = 12 nm for TSMC's N3) but logic gates have been scaling better than DRAM and now are the smallest feature. So the naming scheme isn't that outrageous, TBF.